FIELD-EMISSION SCANNING ELECTRON MICROSCOPE (FE‑SEM) SYSTEM

AI Summary

Argonne National Laboratory is seeking proposals for a Field-Emission Scanning Electron Microscope (FE-SEM) System, including installation and testing services. Proposals are due by January 30, 2026, and must include two priced configurations. For inquiries, contact jdoria@anl.gov by January 26, 2026.

Contract details

Solicitation No.: 6-B175-Q-00131-00
Notice Type: Solicitation
Posted Date: January 20, 2026
Response Deadline: January 30, 2026
NAICS Code: 334516 AI guide
PSC / Class Code: 6640
Issuing Office: ARGONNE NATL LAB - DOE CONTRACTOR
Sub-Agency: DEPARTMENT OF ENERGY
Agency: DEPARTMENT OF ENERGY
Primary Contact: Jenna Doria-Garner
City: Lemont
State: IL
ZIP Code: 60439
AI Product/Service: both

Description

Argonne National Laboratory is seeking to procure the below. Please refer to the Statement of Work, attached, for further details and requirements.

Field-Emission Scanning Electron Microscope (FE‑SEM) System
Installation and Testing

If able to provide the items listed above, please submit your proposal addressing the following requirements by January 30, 2026, at 5:00 PM CST.

For any questions, please contact jdoria@anl.gov no later than Januray 26, 2026, at 12:00 PM CST.

Signature on Page 1 of this document
Proposal - Vendor shall provide two (2) priced configurations:
1. Base System (no ultra-fast beam blanker)
2. Base System + Optional Ultra-Fast Beam Blanker (meeting the requirement above)
Lead Time
Shipping Origin
- If shipping from outside the USA, please confirm Incoterms of DAP are accepted. Additionally, please provide the appropriateHTS Code associated with order
- If shipping from within the USA, please confirm Incoterms FOB Destination are accepted and that the quoted price includes allcosts associated with the order, and it will be the final price at invoicing.
Country of Origin
ANL-70B (Complete)

Key dates

January 20, 2026Posted Date
January 30, 2026Proposals / Responses Due

AI search tags

field-emission scanning electron microscope scientific equipment installation services testing services

Frequently asked questions

FIELD-EMISSION SCANNING ELECTRON MICROSCOPE (FE‑SEM) SYSTEM is a federal acquisition solicitation issued by DEPARTMENT OF ENERGY. Review the full description, attachments, and submission requirements on SamSearch before the response deadline.