Closed Solicitation · DEPARTMENT OF COMMERCE

FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPES

Issued by NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY · DEPT OF COMMERCE NIST

Sol. NB100000-23-00586Combined Synopsis/SolicitationGAITHERSBURG, MD

Closed

STATUS

Closed

closed May 16, 2023

POSTED

May 1, 2023

Publication date

NAICS CODE

334516

Primary industry classification

PSC CODE

—

Product & service classification

AI Summary

The National Institute of Standards and Technology is seeking proposals for focused ion beam scanning electron microscopes. This opportunity is a combined synopsis/solicitation for both commercial products and services, following the guidelines of subpart 12.6. Interested bidders should review the full announcement for additional details.

Contract details

Solicitation No.: NB100000-23-00586
Notice Type: Combined Synopsis/Solicitation
Posted Date: May 1, 2023
Response Deadline: May 16, 2023
NAICS Code: 334516 AI guide
Issuing Office: DEPT OF COMMERCE NIST
Sub-Agency: NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Agency: DEPARTMENT OF COMMERCE
City: GAITHERSBURG
State: MD
ZIP Code: 20899
AI Product/Service: both

Description

This is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the

Key dates

May 1, 2023Posted Date
May 16, 2023Proposals / Responses Due

AI search tags

scanning electron microscopes commercial products commercial services research equipment

Frequently asked questions

FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPES is a federal acquisition solicitation issued by DEPARTMENT OF COMMERCE. Review the full description, attachments, and submission requirements on SamSearch before the response deadline.

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