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Contract Category
1 federal contract opportunities classified as Wafer Characterization.
AI Summary
The National Institute of Standards and Technology (NIST) is seeking information from vendors capable of providing high-quality thin oxide, nitride, and epitaxial germanide films on silicon wafers, along with metrology data. This Sources Sought Notice aims to identify responsible sources and assess industry capabilitie…
MD
Common questions about finding and winning Wafer Characterization government contracts.