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    Closed Solicitation · DEPT OF DEFENSE

    Scanning Electron Microscope

    Issued by DEPT OF THE AIR FORCE · FA4819 325 CONS PKP
    Sol. FA481926Q0009Combined Synopsis/SolicitationSet-aside: No Set aside usedTYNDALL AFB, FL
    Closed
    STATUS
    Closed
    closed Mar 30, 2026
    POSTED
    Mar 20, 2026
    Publication date
    NAICS CODE
    334516
    Primary industry classification
    PSC CODE
    6640
    Product & service classification

    AI Summary

    The Department of the Air Force is seeking quotes for Scanning Electron Microscopes with an extended delivery term of 240 days ARO. The solicitation due date has been extended to March 30, 2026. Interested parties should contact SSgt Nathan Koehn for further details.

    Contract details

    Solicitation No.
    FA481926Q0009
    Notice Type
    Combined Synopsis/Solicitation
    Set-Aside
    No Set aside used
    Posted Date
    March 20, 2026
    Response Deadline
    March 30, 2026
    NAICS Code
    334516AI guide
    PSC / Class Code
    6640
    Contract Code
    5700
    Issuing Office
    FA4819 325 CONS PKP
    Sub-Agency
    DEPT OF THE AIR FORCE
    Agency
    DEPT OF DEFENSE
    Primary Contact
    Nathan Koehn
    City
    TYNDALL AFB
    State
    FL
    ZIP Code
    32403
    AI Product/Service
    product

    Description

    The purpose of this amendment is to: Update attachment 1 Extend the delivery terms from 60 days ARO to 240 days ARO Extend questions due date from 1300 18 March to 1300 25 March. Extend Solicitation due date from 1300 23 March to 1300 30 March. All other terms and conditions remain unchanged Tyndall AFB requires Scanning Electron Microscopes, see attachements for further details. Quotes submitted do not guarantee award. Please contact SSgt Nathan Koehn (nathan.koehn.4@us.af.mil) for quotes or questions.

    Key dates

    1. March 20, 2026Posted Date
    2. March 30, 2026Proposals / Responses Due

    AI search tags

    scanning electron microscopelaboratory equipmentscientific instruments

    Frequently asked questions

    Scanning Electron Microscope is a federal acquisition solicitation issued by DEPT OF DEFENSE. Review the full description, attachments, and submission requirements on SamSearch before the response deadline.

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