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Contract Category
57 federal contract opportunities classified as Scanning Electron Microscope.
NATIONAL AERONAUTICS AND SPACE ADMINISTRATION
AI Summary
NASA is seeking a sole source service agreement for the JEOL Scanning Electron Microscope (SEM) for the period of 2026-2028. This opportunity is classified under NAICS code 811210, focusing on scientific equipment maintenance services.
MS
AI Summary
The Department of Energy intends to negotiate a sole source contract with JEOL USA, Inc. for the renewal of the annual maintenance contract for the JEOL 7600 FESEM Field Emission Scanning Electron Microscope. This contract is crucial for maintaining the instrument's functionality and safety. Interested parties must res…
WV
DEPARTMENT OF HEALTH AND HUMAN SERVICES
AI Summary
The Department of Health and Human Services intends to award a sole source service contract for preventive maintenance and support of the Hitachi S4800I field-emission scanning electron microscope. The contractor will provide unlimited technical support and one onsite yearly preventive maintenance service call.
GA
AI Summary
This opportunity involves a combined synopsis/solicitation for annual preventative maintenance services for the Mira-X Large Chamber Scanning Electron Microscope at Tinker AFB, OK. The requirement is sole source to Ellcie Industries GMBH, and bidders should refer to the Performance Work Statement for details.
OK
AI Summary
The Department of the Air Force is seeking quotes for Scanning Electron Microscopes with an extended delivery term of 240 days ARO. The solicitation due date has been extended to March 30, 2026. Interested parties should contact SSgt Nathan Koehn for further details.
FL
AI Summary
The Department of Defense is soliciting bids for a new field emission scanning electron microscope (FESEM) system. The RFQ will close on April 13th. Interested parties should direct any questions to stefan.b.kitzinger.civ@us.navy.mil.
PA
DEPARTMENT OF HOMELAND SECURITY
AI Summary
The United States Secret Service plans to negotiate solely with Carl Zeiss Microscopy, LLC for maintenance of the proprietary Oxford Energy Dispersive Spectrometer used in their Field Emission Scanning Electron Microscope. This is a special notice, not a solicitation, and inquiries must be submitted via email by March …
DC
AI Summary
This opportunity involves the annual maintenance, support, repair, and software updates for the FEI Helios 600i Focused Ion Beam/Scanning Electron Microscope at Watervliet Arsenal. The procurement is a sole source to FEI Company, and all responsible offerors will be considered. The solicitation is due by March 6, 2026.
NY
AI Summary
The Department of Commerce, National Institute of Standards and Technology, is seeking proposals for an atomic force microscope intended for use in conjunction with a scanning electron microscope. Interested vendors should refer to the attached combined synopsis/solicitation for detailed requirements.
MD
AI Summary
The National Institute of Standards and Technology (NIST) requires a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument for customized measurements. Interested bidders should refer to Solicitation# 1333ND26QNB030053 and the attached documents for detailed requirements.
MD
AI Summary
The National Institute of Standards and Technology intends to negotiate a sole source maintenance agreement for a Tescan 4th generation Scanning Electron Microscope. This opportunity is not a request for competitive quotations, but interested parties may submit responses by 1:00 AM EST on 02/18/25 for consideration.
MD
AI Summary
The Department of Energy is soliciting proposals for a Field-Emission Scanning Electron Microscope (FE?SEM) System, including installation and testing. Proposals are due by January 30, 2026, and must include two configurations. For inquiries, contact jdoria@anl.gov by January 26, 2026.
IL
AI Summary
The Naval Research Laboratory intends to award a sole source purchase order to Bruker AXS for maintenance and services of the STEM X200 scanning electron microscope. This opportunity is not a solicitation for competitive proposals and falls under FAR Part 13 Simplified Acquisition Procedures.
DC
AI Summary
Argonne National Laboratory is seeking proposals for a Field-Emission Scanning Electron Microscope (FE-SEM) System, including installation and testing services. Proposals are due by January 30, 2026, and must include two priced configurations. For inquiries, contact jdoria@anl.gov by January 26, 2026.
IL
AI Summary
Argonne National Laboratory is seeking proposals for a Field-Emission Scanning Electron Microscope (FE-SEM) System, including installation and testing services. Proposals are due by January 30, 2026, and must include two priced configurations. For inquiries, contact jdoria@anl.gov by January 26, 2026.
IL
NATIONAL TRANSPORTATION SAFETY BOARD
AI Summary
The National Transportation Safety Board intends to award a sole source service agreement for an Apreo S LoVac Field Emission - Scanning Electron Microscope. This agreement includes preventative maintenance, certified parts, and technical support. Interested parties are invited to submit capability statements within fi…
DC
AI Summary
The Department of the Navy intends to award a sole source contract to Tescan USA Inc. for annual preventative maintenance and calibration of specialized scanning electron microscopes. This opportunity is not open for competitive quotes, but capability statements may be submitted for consideration. The contract includes…
MD
AI Summary
The Department of Energy is seeking a Phenom XL G3 SEM or an equivalent domestic model. This opportunity is categorized as a combined synopsis/solicitation, and it is essential for the Enrichment Science and Engineering Division's needs.
TN
AI Summary
The National Institute of Standards and Technology seeks a compact atomic force microscope for use in a scanning electron microscope to enhance metrology research in semiconductor manufacturing. This equipment will enable advanced imaging and measurement capabilities critical for evaluating two-dimensional materials an…
MD
AI Summary
The Department of Commerce is seeking sources for a compressed sensing scan generator and related software for scanning electron microscopy. The opportunity is primarily for a product, specifically analytical laboratory instruments, to enhance imaging and measurement solutions in semiconductor manufacturing. Interested…
MD
Common questions about finding and winning Scanning Electron Microscope government contracts.