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7 federal contract opportunities classified as Atomic Force Microscope.
AI Summary
The Department of Commerce, National Institute of Standards and Technology, is seeking proposals for an atomic force microscope intended for use in conjunction with a scanning electron microscope. Interested vendors should refer to the attached combined synopsis/solicitation for detailed requirements.
MD
AI Summary
The Department of Defense is seeking a sole source procurement for one atomic force microscope for advanced research at the United States Naval Academy. This opportunity is a combined synopsis/solicitation under FAR Part 13, and the contract will be awarded to Bruker Nano, Inc. Interested parties may submit proposals b…
VA
AI Summary
The National Institute of Standards and Technology seeks a compact atomic force microscope for use in a scanning electron microscope to enhance metrology research in semiconductor manufacturing. This equipment will enable advanced imaging and measurement capabilities critical for evaluating two-dimensional materials an…
MD
AI Summary
The National Institute of Standards and Technology is seeking sources capable of providing electromagnetic imaging modules for an Atomic Force Microscope. The modules must integrate with existing equipment and meet specific measurement capabilities. If no alternatives are found, a sole source award to Bruker Scientific…
MD
AI Summary
The National Institute of Standards and Technology (NIST) is seeking sources capable of providing electromagnetic imaging modules for an Atomic Force Microscope. This opportunity is a combined sources sought notice and may lead to a sole source award. Interested parties should respond with their capabilities and releva…
MD
AI Summary
The National Institute of Standards and Technology intends to negotiate a sole source acquisition for the Scan Wave 2 Probe Interface module for the Asylum AFM system from PrimeNano. This module is essential for nanoscale impedance characterization and is compatible with existing equipment. Interested parties may submi…
MD
AI Summary
The National Institute of Standards and Technology (NIST) is seeking sources capable of supplying a compatible scan head for the Bruker Dimension Pro 200 Atomic Force Microscope. If no alternatives are identified, a sole source award to Bruker Nano, Inc. is planned. Interested parties must demonstrate their ability to …
MD
Common questions about finding and winning Atomic Force Microscope government contracts.