Closed Solicitation · DEPARTMENT OF COMMERCE

ATOMIC FORCE MICROSCOPE FOR USE IN A SCANNING ELECTRON MICROSCOPE

Issued by NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY · DEPT OF COMMERCE NIST

Sol. 1333ND26QNB030045Combined Synopsis/SolicitationGAITHERSBURG, MD

Closed

STATUS

Closed

closed Feb 19, 2026

POSTED

Feb 10, 2026

Publication date

NAICS CODE

334516

Primary industry classification

PSC CODE

6640

Product & service classification

AI Summary

The Department of Commerce, National Institute of Standards and Technology, is seeking proposals for an atomic force microscope intended for use in conjunction with a scanning electron microscope. Interested vendors should refer to the attached combined synopsis/solicitation for detailed requirements.

Contract details

Solicitation No.: 1333ND26QNB030045
Notice Type: Combined Synopsis/Solicitation
Posted Date: February 10, 2026
Response Deadline: February 19, 2026
NAICS Code: 334516 AI guide
PSC / Class Code: 6640
Issuing Office: DEPT OF COMMERCE NIST
Sub-Agency: NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Agency: DEPARTMENT OF COMMERCE
Primary Contact: Cielo Ibarra
City: GAITHERSBURG
State: MD
ZIP Code: 20899
AI Product/Service: product

Description

Please see attached combined synopsis/solicitation.

Key dates

February 10, 2026Posted Date
February 19, 2026Proposals / Responses Due

AI search tags

atomic force microscope scanning electron microscope scientific instruments

Frequently asked questions

ATOMIC FORCE MICROSCOPE FOR USE IN A SCANNING ELECTRON MICROSCOPE is a federal acquisition solicitation issued by DEPARTMENT OF COMMERCE. Review the full description, attachments, and submission requirements on SamSearch before the response deadline.

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