Focused Ion Beam Government Contracts

AI Summary

The National Institute of Standards and Technology is seeking sources for an ion milling system to prepare transmission electron microscope specimens. The system must meet specific technical requirements, including adjustable ion sources and a compatible vacuum system. Interested vendors should respond with product det…

AI Summary

This opportunity involves the annual maintenance, support, repair, and software updates for the FEI Helios 600i Focused Ion Beam/Scanning Electron Microscope at Watervliet Arsenal. The procurement is a sole source to FEI Company, and all responsible offerors will be considered. The solicitation is due by March 6, 2026.

AI Summary

The National Institute of Standards and Technology (NIST) requires a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument for customized measurements. Interested bidders should refer to Solicitation# 1333ND26QNB030053 and the attached documents for detailed requirements.

AI Summary

The Department of Health and Human Services is seeking proposals for the purchase of a plasma-focused ion beam scanning electron microscope (FIB-SEM). This opportunity is classified under NAICS code 334516 and is not set aside for small businesses. Interested bidders should prepare to submit their proposals by the spec…