Closed Solicitation · DEPARTMENT OF COMMERCE

    FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (FIB-SEM) INSTRUMENT

    Sol. 1333ND26QNB030053Combined Synopsis/SolicitationGAITHERSBURG, MD
    Closed
    STATUS
    Closed
    closed Feb 23, 2026
    POSTED
    Feb 9, 2026
    Publication date
    NAICS CODE
    334516
    Primary industry classification
    PSC CODE
    6640
    Product & service classification

    AI Summary

    The National Institute of Standards and Technology (NIST) requires a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument for customized measurements. Interested bidders should refer to Solicitation# 1333ND26QNB030053 and the attached documents for detailed requirements.

    Contract details

    Solicitation No.
    1333ND26QNB030053
    Notice Type
    Combined Synopsis/Solicitation
    Posted Date
    February 9, 2026
    Response Deadline
    February 23, 2026
    NAICS Code
    334516AI guide
    PSC / Class Code
    6640
    Issuing Office
    DEPT OF COMMERCE NIST
    Primary Contact
    Nina Lin
    State
    MD
    ZIP Code
    20899
    AI Product/Service
    product

    Description

    This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation#  1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details.

    Key dates

    1. February 9, 2026Posted Date
    2. February 23, 2026Proposals / Responses Due

    AI search tags

    Frequently asked questions

    FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (FIB-SEM) INSTRUMENT is a federal acquisition solicitation issued by DEPARTMENT OF COMMERCE. Review the full description, attachments, and submission requirements on SamSearch before the response deadline.

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