Closed Solicitation · DEPARTMENT OF COMMERCE
AI Summary
The National Institute of Standards and Technology (NIST) requires a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument for customized measurements. Interested bidders should refer to Solicitation# 1333ND26QNB030053 and the attached documents for detailed requirements.
This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details.
FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (FIB-SEM) INSTRUMENT is a federal acquisition solicitation issued by DEPARTMENT OF COMMERCE. Review the full description, attachments, and submission requirements on SamSearch before the response deadline.
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