Closed Solicitation · DEPT OF DEFENSE
AI Summary
This opportunity involves the annual maintenance, support, repair, and software updates for the FEI Helios 600i Focused Ion Beam/Scanning Electron Microscope at Watervliet Arsenal. The procurement is a sole source to FEI Company, and all responsible offerors will be considered. The solicitation is due by March 6, 2026.
This solicitation is for the procurement of 1 LOT - Annual maintenance, support, repair and software updates to FEI Helios 600i Focused Ion Beam, (FIB) / Scanning Electron Microscope (SEM) Dual Beam per the attached Performance Work Statement (PWS) for Benet Laboratories. Wage Determination No.2015-4143 latest revision applies and is attached. *** This is a Sole Source Procurement with FEI Company. All Responsible offerors will be considered. ***
Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY is a federal acquisition solicitation issued by DEPT OF DEFENSE. Review the full description, attachments, and submission requirements on SamSearch before the response deadline.
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